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In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu[sub 2]ZnSnS[sub 4] layers for solar cell applications

✍ Scribed by Fontané, X.; Calvo-Barrio, L.; Izquierdo-Roca, V.; Saucedo, E.; Pérez-Rodriguez, A.; Morante, J. R.; Berg, D. M.; Dale, P. J.; Siebentritt, S.


Book ID
120416159
Publisher
American Institute of Physics
Year
2011
Tongue
English
Weight
616 KB
Volume
98
Category
Article
ISSN
0003-6951

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