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Impurity diffusion of Al in Ni single crystals studied by secondary ion mass spectrometry (SIMS)

✍ Scribed by Gust, W. ;Hintz, M. B. ;Loddwg, A. ;Odelius, H. ;Predel, B.

Book ID: 105375240
Publisher: John Wiley and Sons
Year: 1981
Tongue: English
Weight: 512 KB
Volume: 64
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210640120

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