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Impurity diffusion measurements of Bi in liquid Sn using stable density layering and the shear cell technique

✍ Scribed by Shinsuke Suzuki; Kurt-Helmut Kraatz; Günter Frohberg; Raluca Roşu-Pflumm; German Müller-Vogt

Book ID: 116670483
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 275 KB
Volume: 353
Category: Article
ISSN: 0022-3093
DOI: 10.1016/j.jnoncrysol.2007.05.075

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