Impurity bands in moderately doped semiconductors and their effect of the MOS C-V freeze-out characteristics: H. D. Barber, K. C. Lee and J. Erle Jones. Solid-State Electronics19, 365 (1976)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 242 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90707-1