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Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy

✍ Scribed by Payton, O. D.; Picco, L.; Miles, M. J.; Homer, M. E.; Champneys, A. R.

Book ID: 115449191
Publisher: American Institute of Physics
Year: 2012
Tongue: English
Weight: 777 KB
Volume: 83
Category: Article
ISSN: 0034-6748
DOI: 10.1063/1.4747455

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