Improving the image quality of pinhole gated SPECT by modeling the finite dimensions of the pinhole opening during reconstruction

✍ Scribed by VANHOVE, C; LAHOUTTE, T; DEFRISE, M; ANDREYEV, A; BOSSUYT, A; FRANKEN, P

• Book ID: 122497993
• Publisher: Springer
• Year: 2005
• Tongue: English
• Weight: 41 KB
• Volume: 12
• Category: Article
• ISSN: 1071-3581
• DOI: 10.1016/j.nuclcard.2004.12.092