✦ LIBER ✦
Improving the ESD failure threshold of silicided n-MOS output transistors by ensuring uniform current flow
✍ Scribed by Polgreen, T.L.; Chatterjee, A.
- Book ID
- 114534486
- Publisher
- IEEE
- Year
- 1992
- Tongue
- English
- Weight
- 1021 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0018-9383
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