✦ LIBER ✦
Improving hot-electron reliability through circuit analysis and design : Hai Wang, Himadri De, Rajeeva Lahri and Don Haueisen. IEEE/IRPS, 107 (1991)
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 130 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0026-2714
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