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Improvement of sensitivity in an interferometry by controlling pore size on the anodic aluminum oxide chip pore-widening technique

✍ Scribed by Hee Chul An; Jin Young An; Byung-Woo Kim


Book ID
107514097
Publisher
Springer US
Year
2009
Tongue
English
Weight
693 KB
Volume
26
Category
Article
ISSN
0256-1115

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