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Improvement of field and time dependent breakdown of trench capacitor using O/N/O dielectric and rounding off technique

✍ Scribed by Y.K. Fang; C.H. Tsai; C.P. Chiang; F.C. Tseng; Jiann-Ruey Chen


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
402 KB
Volume
33
Category
Article
ISSN
0038-1101

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