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Improvement in reliability of InP-based HEMTs by suppressing impact ionization

✍ Scribed by Naoki Hara; Naoya Okamoto; Kenji Imanishi; Tsuyoshi Takahashi; Kozo Makiyama


Publisher
John Wiley and Sons
Year
2007
Tongue
English
Weight
320 KB
Volume
90
Category
Article
ISSN
8756-663X

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