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Improved understanding of physical defect mechanisms using fault simulation

✍ Scribed by Terry C. Garyet; Nicholas Dickson

Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 842 KB
Volume: 37
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(96)00244-2

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