✦ LIBER ✦
Improved Subthreshold Swing and Gate-Bias Stressing Stability of p-Type Thin-Film Transistors Using a High- Gate Dielectric Grown on a Substrate by Pulsed Laser Ablation
✍ Scribed by Xiao Zou; Guojia Fang; Jiawei Wan; Xun He; Haoning Wang; Nishuang Liu; Hao Long; Xingzhong Zhao
- Book ID
- 114620487
- Publisher
- IEEE
- Year
- 2011
- Tongue
- English
- Weight
- 499 KB
- Volume
- 58
- Category
- Article
- ISSN
- 0018-9383
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