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Improved subthreshold characteristics in tunnel field-effect transistors using shallow junction technologies

✍ Scribed by Chang, Hsu-Yu; Chopra, Saurabh; Adams, Bruce; Li, Jiping; Sharma, Shashank; Kim, Yihwan; Moffatt, Steve; Woo, Jason C.S.

Book ID: 123364442
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 533 KB
Volume: 80
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2012.10.013

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