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Improved spatial resolution in imaging, diffraction, microanalysis and scanning with a field emission TEM/STEM

✍ Scribed by Judith M. Brock; Max T. Otten; Marc J.C. de Jong


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
330 KB
Volume
23
Category
Article
ISSN
0739-6260

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