✦ LIBER ✦
Improved resolution SIMS analysis of annealed Pt/Zn/Pt/ZrB2/Au ohmic contacts to p-InGaAs on InP substrates using back-surface profiling
✍ Scribed by J. Herniman; J.S. Yu; A.E. Staton-Bevan
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 354 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0169-4332
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