Improved Resolution of Local Metal Deposition by Means of Constant Distance Mode Scanning Electrochemical Microscopy

✍ Scribed by Iva Turyan; Mathieu Etienne; Daniel Mandler; Wolfgang Schuhmann

• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 132 KB
• Volume: 17
• Category: Article
• ISSN: 1040-0397
• DOI: 10.1002/elan.200403179