Improved Resistive Switching Properties of Solution-Processed TiO x Film by Incorporating Atomic Layer Deposited TiO 2 layer

✍ Scribed by Kim, Insung; Jung, Seungjae; Shin, Jungho; Biju, Kuyyadi P.; Seo, Kyungah; Siddik, Manzar; Liu, Xinjun; Kong, Jaemin; Lee, Kwanghee; Hwang, Hyunsang

• Book ID: 126782627
• Publisher: Institute of Pure and Applied Physics
• Year: 2011
• Tongue: English
• Weight: 630 KB
• Volume: 50
• Category: Article
• ISSN: 0021-4922
• DOI: 10.1143/jjap.50.046504