✦ LIBER ✦
Improved reliability and yield in thin thermal SiO2: S. T. Wang, E. Harari and W. Y. Nielsen. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 137
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 124 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.