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Improved quantitative analysis of Cu(In,Ga)Se2thin films using MCs+-SIMS depth profiling

✍ Scribed by Lee, Jihye; Kim, Seon Hee; Lee, Kang-Bong; Min, Byoung Koun; Lee, Yeonhee

Book ID
121616705
Publisher
Springer
Year
2013
Tongue
English
Weight
906 KB
Volume
115
Category
Article
ISSN
1432-0630

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The semiconductor band gap of the Cu(In,Ga)Se 2 (CIGSe) compound can be varied by the In to Ga ratio. This composition variation determines the photovoltaic properties of CIGSe thin films. Their composition depth profile has to be optimized in order to obtain maximum efficiencies in solar cell appli