✦ LIBER ✦
Improved process control, lowered costs and reduced risks through the use of non-destructive mobility and sheet carrier density measurements on GaAs and GaN wafers
✍ Scribed by D. Nguyen; K. Hogan; A. Blew; M. Cordes
- Book ID
- 108165926
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 229 KB
- Volume
- 272
- Category
- Article
- ISSN
- 0022-0248
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