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Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing

✍ Scribed by Yaqoob, Zahid; Choi, Wonshik; Oh, Seungeun; Lue, Niyom; Park, Yongkeun; Fang-Yen, Christopher; Dasari, Ramachandra R.; Badizadegan, Kamran; Feld, Michael S.


Book ID
115411319
Publisher
Optical Society of America
Year
2009
Tongue
English
Weight
274 KB
Volume
17
Category
Article
ISSN
1094-4087

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