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Improved metal-dielectric adhesion for interconnect lines of MMICs and ICs: an experimental study

✍ Scribed by R. Gulati; B.K. Sehgal; H.S. Sharma; Seema Vinayak; Sindhu Dayal; A.A. Naik


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
841 KB
Volume
28
Category
Article
ISSN
0921-5107

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