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Improved measurement accuracy for the thickness of YBa2Cu3O7−δfilms by using a single two-resonance-mode sapphire resonator

✍ Scribed by Jae Hun Lee; Myung Su Kim; Hyun Kyung Han; Ho Sang Jung; Woo Il Yang; Sang Young Lee; Byungwoo Park; Sang-Geun Lee


Book ID
119977792
Publisher
The Korean Physical Society
Year
2012
Tongue
English
Weight
350 KB
Volume
60
Category
Article
ISSN
0374-4884

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