✦ LIBER ✦
Improved low frequency noise characteristics of sub-micron MOSFETs with TaSiN/TiN gate on ALD HfO2 dielectric
✍ Scribed by Siva Prasad Devireddy; Bigang Min; Zeynep Çelik-Butler; Hsing-Huang Tseng; Philip J. Tobin; Ania Zlotnicka
- Book ID
- 108210716
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 178 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0026-2714
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