Improved leakage property and reduced crystallization temperature by V2O5 seed layer in K0.4Na0.6NbO3 thin films derived from chemical solution deposition

✍ Scribed by Li, N.; Li, W.L.; Wang, L.D.; Xu, D.; Chi, Q.G.; Fei, W.D.

• Book ID: 123417453
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 777 KB
• Volume: 552
• Category: Article
• ISSN: 0925-8388
• DOI: 10.1016/j.jallcom.2012.10.072