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Improved EOT and leakage current for metal–insulator–metal capacitor stacks with rutile TiO2

✍ Scribed by Mihaela Popovici; Min-Soo Kim; Kazuyuki Tomida; Johan Swerts; Hilde Tielens; Alain Moussa; Olivier Richard; Hugo Bender; Alexis Franquet; Thierry Conard; Laith Altimime; Sven Van Elshocht; Jorge A. Kittl


Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
593 KB
Volume
88
Category
Article
ISSN
0167-9317

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