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Improved Defect and Fourier Transform Infrared Spectroscopy Analysis for Prediction of Yield for HgCdTe Multilayer Heterostructures

✍ Scribed by D.D. Lofgreen; M.F. Vilela; E.P. Smith; M.D. Newton; D. Beard; S.M. Johnson

No coin nor oath required. For personal study only.

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