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Improved critical area prediction by application of pattern recognition techniques

✍ Scribed by J.H.N. Mattick; R.W. Kelsall; R.E. Miles

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 360 KB
Volume: 36
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(96)00204-1

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