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Imposition of defined states of stress on thin films by a wafer-curvature method; validation and application to aging Sn films

✍ Scribed by Stein, J.; Pascher, M.; Welzel, U.; Huegel, W.; Mittemeijer, E.J.


Book ID
126129414
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
898 KB
Volume
568
Category
Article
ISSN
0040-6090

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