✦ LIBER ✦
Implications of a localised defect model for wafer level reliability measurements of thin dielectrics
✍ Scribed by Paula O'Sullivan; Alan Mathewson
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 248 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.