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Implementation of nonlocal model for impact-ionization current in bipolar circuit simulation and application to SiGe HBT design optimization

✍ Scribed by Hong, G.-B.; Fossum, J.G.


Book ID
114536094
Publisher
IEEE
Year
1995
Tongue
English
Weight
774 KB
Volume
42
Category
Article
ISSN
0018-9383

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