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Impact of the Ge concentration on the Ge-ionisation probability and the matrix sputter yield for a SiGe matrix under oxygen irradiation

✍ Scribed by C. Huyghebaert; T. Conard; B. Brijs; W. Vandervorst


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
245 KB
Volume
231-232
Category
Article
ISSN
0169-4332

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