✦ LIBER ✦
Impact of Random Telegraph Noise Profiles on Drain-Current Fluctuation During Dynamic Gate Bias
✍ Scribed by Feng, Wei; Dou, Chun Meng; Niwa, Masaaki; Yamada, Keisaku; Ohmori, Kenji
- Book ID
- 121442713
- Publisher
- IEEE
- Year
- 2014
- Tongue
- English
- Weight
- 507 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0741-3106
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