✦ LIBER ✦
Impact of PDA temperature on electron trap energy and spatial distributions in SiO2/Al2O3 stack as the IPD in Flash memory cells
✍ Scribed by X.F. Zheng; W.D. Zhang; B. Govoreanu; J.F. Zhang; J. Van Houdt
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 379 KB
- Volume
- 86
- Category
- Article
- ISSN
- 0167-9317
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