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Impact of measuring electron tracks in high-resolution scientific charge-coupled devices within Compton imaging systems

✍ Scribed by D.H. Chivers; A. Coffer; B. Plimley; K. Vetter


Book ID
113822123
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
925 KB
Volume
654
Category
Article
ISSN
0168-9002

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