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Impact of LDD structures on the operation of silicon MOSFETs at low temperature

✍ Scribed by I.M. Hafez; G. Ghibaudo; F. Balestra; M. Haond

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 438 KB
Volume: 38
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(94)e0055-j

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