✦ LIBER ✦
Impact of HfTaO Buffer Layer on Data Retention Characteristics of Ferroelectric-Gate FET for Nonvolatile Memory Applications
✍ Scribed by Minghua Tang; Xiaolei Xu; Zhi Ye; Sugiyama, Y.; Ishiwara, H.
- Book ID
- 114620291
- Publisher
- IEEE
- Year
- 2011
- Tongue
- English
- Weight
- 679 KB
- Volume
- 58
- Category
- Article
- ISSN
- 0018-9383
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