✦ LIBER ✦
Impact of GeOx interfacial layer thickness on Al2O3/Ge MOS interface properties
✍ Scribed by R. Zhang; T. Iwasaki; N. Taoka; M. Takenaka; S. Takagi
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 518 KB
- Volume
- 88
- Category
- Article
- ISSN
- 0167-9317
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