Impact of collector-base junction traps on low-frequency noise in high breakdown Voltage SiGe HBTs

✍ Scribed by Jin Tang; Guofu Niu; Joseph, A.J.; Harame, D.L.

• Book ID: 114617529
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 609 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2004.833582