✦ LIBER ✦
Impact of CMOS processing steps on the drain current kink of NMOSFETs at liquid helium temperature
✍ Scribed by Simoen, E.; Claeys, C.
- Book ID
- 114538702
- Publisher
- IEEE
- Year
- 2001
- Tongue
- English
- Weight
- 202 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0018-9383
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