✦ LIBER ✦
Impact of bilayer character on High K gate stack dielectrics breakdown obtained by conductive atomic force microscopy
✍ Scribed by Foissac, R.; Blonkowski, S.; Kogelschatz, M.; Delcroix, P.; Gros-Jean, M.; Bassani, F.
- Book ID
- 123530582
- Publisher
- Elsevier Science
- Year
- 2013
- Tongue
- English
- Weight
- 869 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0026-2714
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