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Impact of a high electric field on the extraction of the generation lifetime from the reverse generation current component of shallow n+-p-well diodes
✍ Scribed by Poyai, A.; Simoen, E.; Claeys, C.
- Book ID
- 114538888
- Publisher
- IEEE
- Year
- 2001
- Tongue
- English
- Weight
- 75 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0018-9383
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