✦ LIBER ✦
Impact ionization characteristics of III-V semiconductors for a wide range of multiplication region thicknesses
✍ Scribed by Yuan, P.; Hansing, C.C.; Anselm, K.A.; Lenox, C.V.; Nie, H.; Holmes, A.L., Jr.; Streetman, B.G.; Campbell, J.C.
- Book ID
- 117869473
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 157 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0018-9197
- DOI
- 10.1109/3.823466
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