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Imaging with reflection near-field optical microscope: contributions of middle and far fields

โœ Scribed by Mufei Xiao; Sergey Bozhevolnyi

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
859 KB
Volume
130
Category
Article
ISSN
0030-4018

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Tapping mode atomic force microscope combined with reflection scanning near-field optical microscope (AF/RSNOM)
โœ Yinli Li; Shifa Wu; Pengfei Li; Jian Zhang; Shi Pan ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 204 KB

A new kind of scanning probe microscope is introduced in this paper, which is a combination of atomic force microscope and reflection scanning near field optical microscopy (AF/RSNOM) with equi-amplitude tapping mode. The principle and recent experiment result of AF/RSNOM are reported. Besides conve