𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Imaging silicon by atomic force microscopy with crystallographically oriented tips

✍ Scribed by F.J. Giessibl; S. Hembacher; H. Bielefeldt; J. Mannhart

Book ID
106023856
Publisher
Springer
Year
2001
Tongue
English
Weight
108 KB
Volume
72
Category
Article
ISSN
1432-0630

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Quality assessment of atomic force micro
Quality assessment of atomic force microscopy probes by scanning electron microscopy: Correlation of tip structure with rendered images
✍ Taatjes, Douglas J.; Quinn, Anthony S.; Lewis, Michael R.; Bovill, Edwin G. πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 855 KB

While image quality from instruments such as electron microscopes, light microscopes, and confocal laser scanning microscopes is mostly influenced by the alignment of optical train components, the atomic force microscope differs in that image quality is highly dependent upon a consumable component,

High Molecular Orientation in Mono- and
High Molecular Orientation in Mono- and Trilayer Polydiacetylene Films Imaged by Atomic Force Microscopy
✍ Darryl Y. Sasaki; Robert W. Carpick; Alan R. Burns πŸ“‚ Article πŸ“… 2000 πŸ› Elsevier Science 🌐 English βš– 269 KB

Atomically flat monolayer and trilayer films of polydiacetylenes have been prepared on mica and silicon using a horizontal deposition technique from a pure water subphase. Langmuir films of 10,12-pentacosadiynoic acid (I) and N-(2-ethanol)-10,12-pentacosadiynamide (II) were compressed to 20 mN/m and