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Imaging of passivated III–V semiconductor surfaces by a scanning tunneling microscope operating in air

✍ Scribed by J.A. Dagata; W. Tseng; J. Bennett; J. Schneir; H.H. Harary


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
561 KB
Volume
42-44
Category
Article
ISSN
0304-3991

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