Imaging crystal growth features using scanning force microscopy (SFM)

✍ Scribed by S. Kipp; Dr. S. Kämmer; Prof. Dr.-Ing. R. Lacmann; Dr. J. Rolfs; U. Tanneberger; Dr. habil. W. Beckmann

• Publisher: John Wiley and Sons
• Year: 1994
• Tongue: English
• Weight: 483 KB
• Volume: 29
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/crat.2170290716