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Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy

✍ Scribed by Peter Hermann; Michael Hecker; Dmytro Chumakov; Martin Weisheit; Jochen Rinderknecht; Artem Shelaev; Pavel Dorozhkin; Lukas M. Eng

Book ID: 113940550
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 926 KB
Volume: 111
Category: Article
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2011.08.009

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