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Image indexing using spatial texture pattern for CE applications

✍ Scribed by Ki Tae Park; Jeong Ho Lee; Young Shik Moon


Book ID
117910704
Publisher
IEEE
Year
2009
Tongue
English
Weight
397 KB
Volume
55
Category
Article
ISSN
0098-3063

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When interpreting three-dimensional images it is difficult to understand the local concentration of line patterns and hence quantification of the latter is important. In this paper, a concentration index, previously reported to provide an effective characteristic for quantitatively evaluating the lo